X-ray diffraction procedures for polycrystalline and amorphous materials
نویسندگان
چکیده
منابع مشابه
X-Ray Imaging of Polycrystalline and Amorphous Materials
A novel method for obtaining position resolved information simultaneously from an entire plane of a polycrystalline or amorphous sample using the diffracted radiation or fluorescence has been developed. It makes use of a microchannelplate as a collimator in front of a position sensitive detector (CCDcamera). Experiments may be performed either in transmission or in reflection geometry. In the f...
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We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ~10(3)-10(4) s(-1) in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This appr...
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ew opportunities for 3D materials science of polycrystalline materials at the icrometre lengthscale by combined use of X-ray diffraction and X-ray imaging
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The amorphous alloys Ti 6 7 Si 3 3 , V 6 7Si 3 3 , and Cr , 7 Si 3 3 were produced by sputtering. Their structure was investigated by X-ray and neutron diffraction. X-ray diffraction showed that the structure of the three metallic glasses is not isomorphous. Neutron diffraction showed that S i -S i atomic pairs occur preferentially with distances distinctly larger than the atomic diameter of th...
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ژورنال
عنوان ژورنال: Journal of Chemical Education
سال: 1955
ISSN: 0021-9584,1938-1328
DOI: 10.1021/ed032p228.2